Advertisement
Product Releases
Advertisement

Correlative Microscopy Solution Set

Fri, 11/30/2012 - 8:42am

FEI correlative light and electron microscopyFEI announced a suite of solutions for correlative light and electron microscopy (CLEM). New methods in correlative microscopy from FEI bring data from different imaging techniques together automatically. Electron microscopy (EM) offers extremely high image resolution—1,000 or more times better than light microscopes. Light microscopes (LM) offer a wide variety of specialized techniques, such as fluorescent labeling, that can identify a single molecule or structure within a large, complex environment like the interior of a living cell. Correlating between the two techniques allows scientists to use LM to find the target and EM to explore its form and function. Correlative microscopy allows investigators to find a feature of interest faster in the EM, gain additional information about its structure down to the molecular scale, and understand relationships between the feature and its larger scale context.

The correlative microscopy solution set from FEI includes:

  • Tecnai with iCorr—a fully-integrated workflow in which the light microscope is incorporated into a transmission electron microscope (TEM) column.
  • CorrSight— an advanced light microscope dedicated to the different steps of correlative experiments, enabling researchers to image live cell dynamics and quickly fix those cells for EM.
  • MAPS—a software solution that allows correlation between the electron microscope image and an image from any other source through a simple alignment procedure.

FEI, 866-693-3426, www.fei.com/correlative-microscopy

Advertisement

Share this Story

X
You may login with either your assigned username or your e-mail address.
The password field is case sensitive.
Loading