Atomic force microscopy (AFM) and scanning probe microscopy (SPM) solutions provide in situ imaging capabilities for an expanding set of life science applications. The MAC Mode III offers a simple, gentle method for AFM scanning in fluid. This technique allows single-pass imaging concurrent with Kelvin force microscopy (KFM) and electric force microscopy (EFM). High harmonic imaging is supported as well. High-precision temperature and environmental controls do not compromise atomic resolution. An electrochemical scanning probe microscopy option that includes a kit for high-resolution in situ EC-SPM experiments is also available. Agilent Technologies, Inc., 800-227-9770, www.agilent.com.